Wavelink probe system

Unprecedented Flexibility for Probe Interconnection

WaveLink probes provide industry leading technology for wideband signal connection to test instruments. The first differential probes to employ SiGe technology, they deliver full system bandwidth when used with LeCroy 6 GHz, 5 GHz, and 3 GHz instruments. While other probes have higher DC resistance, their loading impedance quickly drops to very low values at relatively low frequencies. Most cross below the WaveLink impedance at only 200 MHz. WaveLink probes:

Use transmission line topology in the input section combined with active differential probe technology
Maintain essentially constant input loading from DC to several GHz

Very Accurate Eye Pattern Measurements

WaveLink probes virtually eliminate distortion when measuring signals. This benefit is particularly useful in eye pattern measurements, now routine for systems using fast serial parallel data bus architecture.

All WaveLink probes offer:

Superior loading characteristics
Precise frequency response with outstanding fidelity for high-speed signals

Both low loading and frequency response flatness are needed to ensure the signal fidelity required to measure performance accurately.

The Signal Fidelity Advantage is Built In

WaveLink is the first differential probe to use a unique calibration process to achieve superb waveform fidelity for routine voltage measurements. Calibration coefficients “fine tune” the frequency response of each WaveLink probe and are individually determined and programmed into the probe. The WaveMaster,® SDA, DDA, or WavePro® 7000A Series oscilloscopes read this data and use it to digitally compensate the entire system response for superior fidelity.

Flexible Interconnection Options — Without Sacrificing Performance

D500PT Positioner Mounted Probe Tip Module

The probe has a very thin form factor, allowing multiple probes to be used when several channels are required to monitor signals from the same small IC. It has 2 mm of Z-axis compliance through spring-loaded telescoping tips, allowing considerable angular freedom relative to the circuit board while still maintaining reliable contact with both inputs. A ball joint between the tip and mounting arm makes it even easier to adjust for placement when already mounted in a positioner. A small thumbscrew allows precise and secure adjustment of the tip spacing.

The Positioner Mounted Module, D500PT, can be used as a browser in a positioner such as Easy Probe. Because of its thin form factor and spring-loaded tips, it is ideally suited for use with multiple probes in tight areas, such as the back side of boards with ball-grid array packaged ICs.


The WaveLink Differential Probe Series are high bandwidth active differential probes. These probes are suited for signal integrity measurements in high-speed digital systems.	The Probe Tip Modules contain the active amplifier circuitry. Different modules have different electrical and physical interconnect characteristics, allowing the user to select the module appropriate for the application.

D600A-AT and D300A-AT Adjustable Tips

WaveLink adjustable tip probes are designed to provide an optimum mechanical connection for signal measurement.

Built-in thumbwheel for precise positioning of tip—stays put after adjustment
Maintains sharp points for good contact
Tips made of “NiTiNOL,” a super-elastic nickel-titanium alloy
Flexes as you apply pressure
Consistently returns to original form

EZ-Probe Positioner

The EZ-Probe positioner provides stable, accurate positioning in the x-y-z axis. Ideal for use with the D500PT and D600A-AT / D300A-AT probe tips. The unique, 3:1 motion reduction joystick allows simple, precise positioning of the attached probe in both the horizontal and vertical measuring plane. The probe has a fully articulating arm, providing 30 cm (12") reach in virtually any direction.

WaveLink D600ST and D350ST

Best-in-class mechanical design for optimum utility:

Small tip, high bandwidth differential probe
Three interconnect configurations for flexibility
Very small form factor for accessing tight spaces

Each of the interchangeable leads is a thin, highly flexible 145 mm (5.7") long lead connecting the tip and the D600ST/D350ST probe tip module.

Three Different Tips for Interconnect Flexibility

A. Solder-In Lead The Solder-In interconnect lead features the smallest physical tip size of any high bandwidth differential probe and the highest level of electrical performance. Two very small damping resistors are directly soldered into the connect points providing a reliable, intermittence-free electrical connection. The resistors have highly flexible leads allowing connection to input points with a wide range of input spacing.	B. Quick Connect (D600ST only) The Quick Connect interconnect lead enables you to quickly move the probe between multiple test points on the test circuit. Just solder a pair of damping resistors at each location where interconnection is required. A small connector mounted on the probe tip plugs into the damping resistors, letting you quickly move between sets of test points.	C. Square Pin Many applications, such as IC characterization boards, use standard 0.025" square pins for interconnect. The Square Pin interconnect lead directly mates with a pair of 0.025" (0.635 mm) square pins that are mounted on standard 0.100" (2.54 mm) centers.

For more information about Differential Probes contact us